Database of Zeolite Structures
 
Framework Type EVF
Powder Diffraction Pattern for EMM-75, calcined
Input Parameters
  Wavelength:  or
  2θ range:
  Step size:
  Polarization factor:
  Background:
  Reference peak is
    peak closest to °2θ
    reflection (hkl)
       scaled to
  Intensity axis:
     
Peak shape
  Pseudo-Voigt: (1-n)Gaussian + n Lorentzian
  FWHM = sqrt (U + V tan θ + W tan2θ)
  Mixing parameter (n): %
  Peak range: FWHM
  Peak width:
    set UVW at: U =   V =   W =
    FWHM =
    FWHM =
  FWHM =
   
Select Output
 
List hkl and intensity
List powder pattern
plot powder pattern
Crystal Data
  Space Group: P n n m   (# 58)   
  Cell parameters: a = 7.3673 Å b = 17.774Å c = 21.569 Å
    α = 90° β = 90° γ = 90 °
  Chemical Formula [Si48O96]-EVF
  Refinement: 3D Electron diffraction
  Reference: Ikonnikova, E., Cho, J., Zou, X., Sutrisno, A., Burton, A., Pham, T., Willhammar, T.
J. Am. Chem. Soc., 148, 6686–6694 (2026)
  Atomic Coordinates:          
   
Atom
Form Factor
x
y
z
PP
B(iso)
    
  Si1
Si
0.9629 0.9133 0.3694 1 1.33
  Si2
Si
0.5456 0.915 0.3693 1 1.36
  Si3
Si
0.2525 0.8137 0.4293 1 1.35
  Si4
Si
0.2408 0.7045 0.3181 1 1.24
  Si5
Si
-0.0356 0.5858 0.2764 1 1.11
  Si6
Si
0.1016 0.8428 0.2425 1 1.37
  O1
O
1.0207 0.8886 0.3012 1 5.05
  O2
O
1.0783 0.8668 0.4183 1 3.63
  O3
O
1 1 0.3816 1 3.95
  O4
O
0.7557 0.8972 0.3839 1 3.08
  O5
O
0.5 1 0.3887 1 2.53
  O6
O
0.4312 0.8582 0.4117 1 3
  O7
O
0.2563 0.7866 0.5 1 2.29
  O8
O
0.2338 0.7401 0.3863 1 3
  O9
O
0.1907 0.7654 0.2662 1 2.14
  O10
O
0.2544 0.8926 0.2077 1 2.29
  O11
O
-0.0557 0.8258 0.1949 1 3.55
  O12
O
0.0984 0.6367 0.3175 1 2.53
  O13
O
0 0.5 0.2938 1 2.29
  O14
O
-0.0021 0.6001 0.2038 1 3.79


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