OSI: XPD Pattern

Framework Type OSI

Powder Diffraction Pattern for UiO-6, Calcined

Input Parameters

Peak shape
	Pseudo-Voigt: (1-n)Gaussian + n Lorentzian
	FWHM = sqrt (U + V tan θ + W tan²θ)
	Mixing parameter (n):		%
	Peak range:		FWHM
	Peak width:
		set UVW at:	U = V = W =
		Calculate UVW such that	FWHM = at °2θ
			FWHM = at °2θ
			FWHM = at °2θ

Select Output

List hkl and intensity

List powder pattern

plot powder pattern

Crystal Data
	Space Group:	I m m 2	(# 44)
	Cell parameters:	a = 18.3549 Å	b = 18.3206Å	c = 5.053 Å
		α = 90°	β = 90°	γ = 90 °
	Chemical Formula	[Al₁₆P₁₆O₆₄]-OSI
	Refinement:	X-ray Rietveld refinement, R_p = 0.044, R_wp = 0.059

Reference:

Akporiaye, D.E., Fjellvåg, H., Halvorsen, E.N., Haug, T., Karlsson, A. and Lillerud, K.P.
Chem. Commun., , 1553-1554 (1996)