OFF: XPD Plot (verified syntheses)

Data from

Verified Syntheses of Zeolitic Materials Fourth Edition
S. Mintova and M. Fahda
Synthesis recipe (PDF) for Offretite, page 305

Measurement conditions

Diffractometer:
XRDynamic500, Bragg-Brentano geometry
Primux 3000 Cu LFF source
Ni/C multilayer primary monochromator

Detector:
Pixos 2000 Si detector

Measurement:
source and detection optics under vacuum
fixed divergence slit of 0.25 mm (0.06°)
primary and secondary Soller slits of 0.05 rad
automatic anti scattering slit (5.7 mm)in front of the detector.

Radiation:
CuKα_1,2, wavelength = 1.54180

Measured by:
Aymeric Magisson
Normandie Université
ENSICAEN, UNICAEN, CNRS, LCS
14050 Caen, France

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