MFI: XPD Plot (verified syntheses)

Data from

Verified Syntheses of Zeolitic Materials Fourth Edition
S. Mintova and M. Fahda
Synthesis recipe (PDF) for Template-free ZSM-5, page 152

Measurement conditions

Diffractometer:
Bruker D8 Advance diffractometer, Bragg-Brentano geometry
Ge-focusing monochromator

Detector:
Lynxeye detector operated with a 3.5° opening

Measurement:
A fixed divergence slit of 0.6 mm
primary and secondary Soller slits of 2.5°
beam knife
8 mm anti-scattering slit in front of the detector

Radiation:
CuKα₁, wavelength = 1.54060

Measured by:
Nicolas Barrier
Normandie Université
ENSICAEN, UNICAEN, CNRS, CRISMAT
14050 Caen, France

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Download

Download diffraction data for Template-free ZSM-5 as a text file