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ITQ-26
XPD
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ITQ-26
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Powder Pattern
Framework Type
IWS
Powder Diffraction Pattern for ITQ-26
Input Parameters
Wavelength:
As specified
CrA1 (2.28970 Å)
CrA2 (2.29361 Å)
Cr (2.29090 Å)
FeA1 (1.93604 Å)
FeA2 (1.93998 Å)
>Fe (1.93730 Å)
CuA1 (1.54056 Å)
CuA2 (1.54439 Å)>
Cu (1.54180 Å)
MoA1 (0.70930 Å)
MoA2 (0.71359 Å)
Mo (0.71070 Å)
AgA1 (0.55941 Å)
AgA2 (0.56380 Å)
Ag (0.56080 Å)
or
Å
keV
2θ range:
° -
°
Step size:
°2θ
Polarization factor:
Background:
Reference peak is
highest peak in 2θ range
peak closest to
°2θ
reflection (
hkl
)
scaled to
Intensity axis:
-
Peak shape
Pseudo-Voigt: (1-
n
)Gaussian +
n
Lorentzian
FWHM = sqrt (U + V tan θ + W tan
2
θ)
Mixing parameter (
n
):
%
Peak range:
FWHM
Peak width:
set UVW at:
U =
V =
W =
Calculate UVW such that
FWHM =
at
°2θ
FWHM =
at
°2θ
FWHM =
at
°2θ
Select Output
List hkl and intensity
List powder pattern
plot powder pattern
Crystal Data
Space Group:
I 4/m m m
(# 139)
Cell parameters:
a
=
26.7769 Å
b
=
26.7769Å
c
=
13.2505 Å
α =
90°
β =
90°
γ =
90 °
Chemical Formula
[
Ge
27.2
Si
108.8
O
272
]
-
IWS
Refinement:
Reference:
Dorset, D.L., Strohmaier, K.G., Kliewer, C.E., Corma, A., Díaz-Cabañas, M.J., Rey, F. and Gilmore, C.J.
Chem. Mater.
,
20
, 5325-5331 (2008)
Atomic Coordinates:
Atom
Form Factor
x
y
z
PP
B(iso)
Ge1
Ge
0.0586
0.3209
0.1176
0.32
2
Si2
Si
0.0586
0.3209
0.1176
0.68
2
Ge3
Ge
0.0584
0.2043
0.1179
0.32
2
Si4
Si
0.0584
0.2043
0.1179
0.68
2
Ge5
Ge
0.0582
0.0582
0.3825
0.32
2
Si6
Si
0.0582
0.0582
0.3825
0.68
2
Si7
Si
0.105
0.105
0.1891
1
2
Si8
Si
0.0884
0.4116
0.25
1
2
Si9
Si
0.0574
0.0574
0
1
2
Si10
Si
0
0.4427
0.3837
1
2
O11
O
0.0629
0.341
0
1
2
O12
O
0
0.3194
0.155
1
2
O13
O
0.0791
0.2625
0.1238
1
2
O14
O
0.0876
0.3568
0.1983
1
2
O15
O
0.0948
0.1645
0.1785
1
2
O16
O
0.0571
0.1849
0
1
2
O17
O
0
0.202
0.1599
1
2
O18
O
0.0726
0.0726
0.5
1
2
O19
O
0
0.0718
0.3565
1
2
O20
O
0.0924
0.0924
0.3049
1
2
O21
O
0.0755
0.0755
0.1059
1
2
O22
O
0.0845
0.4517
0.1624
1
2
O23
O
0
0.0711
0
1
2
O24
O
0
0.5
0.3529
1
2
O25
O
0
0.429
0.5
1
2
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IZA-SC
)