XPD stack plot for MTT-TON
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Data details | |
| Patterns calculated by | |
| Hermann Gies | |
| Institute of Geology, Mineralogy and Geophysics, Ruhr University Bochum, Germany | |
| Calculation | |
| Program used: Program used: DIFFaX by Michael M.J. Treacy | |
| Method: Random stacking of MTT or TON slabs, taking into account the relative percentages of the polymorphs MTT and TON. | |
| Wavelength: 1.5406Å | |