XPD stack plot for ERI-LEV
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Data details | |
| Patterns calculated by | |
| Dan Xie | |
| Chevron Technical Center, Richmond, California 94801, USA | |
| Calculation | |
| Program used: DIFFaX by Michael M.J. Treacy | |
| Method: Random stacking of ERI or LEV slabs, taking into account the relative percentages of the polymorphs ERI and LEV | |
| Wavelength: 1.5406Å | |